{"id":8,"date":"2017-10-17T12:40:24","date_gmt":"2017-10-17T03:40:24","guid":{"rendered":"http:\/\/www.nanosystem-solutions.com\/en\/admin\/?page_id=8"},"modified":"2024-06-14T16:34:38","modified_gmt":"2024-06-14T07:34:38","slug":"inspection","status":"publish","type":"page","link":"https:\/\/www.nanosystem-solutions.com\/en\/product\/inspection","title":{"rendered":"Visual Inspection Systems"},"content":{"rendered":"

Visual<\/b> Inspection Systems<\/b><\/h2>\n

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Visual Inspection equipments for defects on outside or inside at Si-Wafer or glass substrate with our unique optical and image processing technology.<\/p>\n

Inspection Target : Edge<\/h4>\n

Defects such as chips and cracks in edge inspection are detected with our unique optical and image processing technologies.<\/p>\n

Inspection Target : Back\/ Front Surface<\/h4>\n

Defects such as particles and scratches in backside and surface inspection are detected with our unique optical and image processing technologies.<\/p>\n

Inspection Target: Pinhole (AirPocket)<\/h4>\n

Detects pinholes (air pockets) and other defects in surface and internal inspections using proprietary optical and image processing technologies.<\/p>\n

Equipment Line-up<\/h4>\n
    \n
  • Edge Inspection Equipment<\/li>\n
  • Back&Front Surface Equipment<\/li>\n
  • Edge\uff0fBack\uff0fFront Surface\uff0fPinhole(Airpocket) Equipment<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"

    Visual Inspection Systems Visual Inspection equipments for defects on outside or inside at Si-Wafer or glass s […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":6,"menu_order":2,"comment_status":"closed","ping_status":"closed","template":"page-col2_.php","meta":{"_monsterinsights_skip_tracking":false,"footnotes":""},"class_list":["post-8","page","type-page","status-publish","hentry"],"aioseo_notices":[],"aioseo_head":"\n\t\t\n\t\n\t\n\t\n\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t\n\t\t