{"id":8,"date":"2017-10-17T12:40:24","date_gmt":"2017-10-17T03:40:24","guid":{"rendered":"http:\/\/www.nanosystem-solutions.com\/en\/admin\/?page_id=8"},"modified":"2024-06-14T16:34:38","modified_gmt":"2024-06-14T07:34:38","slug":"inspection","status":"publish","type":"page","link":"https:\/\/www.nanosystem-solutions.com\/en\/product\/inspection","title":{"rendered":"Visual Inspection Systems"},"content":{"rendered":"<h2><b>Visual<\/b><b> Inspection Systems<\/b><\/h2>\n<p><img decoding=\"async\" class=\"alignleft\" src=\"\/en\/admin\/wp-content\/themes\/2017.10_en\/images\/product_inspection_img_01.jpg\" alt=\"\" \/><\/p>\n<p>Visual Inspection equipments for defects on outside or inside at Si-Wafer or glass substrate with our unique optical and image processing technology.<\/p>\n<h4>Inspection Target : Edge<\/h4>\n<p>Defects such as chips and cracks in edge inspection are detected with our unique optical and image processing technologies.<\/p>\n<h4>Inspection Target : Back\/ Front Surface<\/h4>\n<p>Defects such as particles and scratches in backside and surface inspection are detected with our unique optical and image processing technologies.<\/p>\n<h4>Inspection Target: Pinhole (AirPocket)<\/h4>\n<p>Detects pinholes (air pockets) and other defects in surface and internal inspections using proprietary optical and image processing technologies.<\/p>\n<h4>Equipment Line-up<\/h4>\n<ul class=\"check\">\n<li>Edge Inspection Equipment<\/li>\n<li>Back&amp;Front Surface Equipment<\/li>\n<li>Edge\uff0fBack\uff0fFront Surface\uff0fPinhole(Airpocket) Equipment<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Visual Inspection Systems Visual Inspection equipments for defects on outside or inside at Si-Wafer or glass s [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":6,"menu_order":2,"comment_status":"closed","ping_status":"closed","template":"page-col2_.php","meta":{"_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"footnotes":""},"class_list":["post-8","page","type-page","status-publish","hentry"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/pages\/8","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/comments?post=8"}],"version-history":[{"count":0,"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/pages\/8\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/pages\/6"}],"wp:attachment":[{"href":"https:\/\/www.nanosystem-solutions.com\/en\/wp-json\/wp\/v2\/media?parent=8"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}